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MACKŮ, R.; TOMÁNEK, P.; KOKTAVÝ, P.
Original Title
Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
We investigate localized defects in silicon solar cells. These imperfections represent a real problem because they can lead to long-term degradation and decreasing conversion efficiency of solar cells. Thus, this paper presents a systematic optical investigation of local defects and their correlation with rectangular microplasma fluctuations. A sensitive CCD camera has been used for mapping the surface photon emission from localized defects. The operation point of the samples has been set to reverse bias mode and varying electric fields were applied. It turns out that some solar cells exhibit imperfection in the bulk and also close to the cell edges. However, we confine our work here to bulk. Using a combination of optical investigations and electrical noise measurement in the time and spectral domain, we reveal a direct correlation between noise and photon emission. The results for several defect spots are presented in detail.
English abstract
Keywords
Solar cell, microplasma noise, local defect, photon emission, electric breakdown
Key words in English
Authors
RIV year
2012
Released
15.10.2011
Publisher
SPIE
Location
USA
ISBN
0277-786X
Periodical
Proceedings of SPIE
Volume
8036
Number
8306
State
United States of America
Pages from
1I1
Pages to
1I6
Pages count
6