Přístupnostní navigace
E-application
Search Search Close
Publication result detail
ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.
Original Title
Microscale comparison of solar cell recombination centers
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique.
English abstract
Keywords
solar cell, defects
Key words in English
Authors
RIV year
2012
Released
27.06.2011
Publisher
ZČU
Location
Plzeň
ISBN
1802-4564
Periodical
ElectroScope - http://www.electroscope.zcu.cz
Volume
2011
Number
4
State
Czech Republic
Pages from
25
Pages to
28
Pages count
BibTex
@article{BUT75327, author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý}", title="Microscale comparison of solar cell recombination centers", journal="ElectroScope - http://www.electroscope.zcu.cz", year="2011", volume="2011", number="4", pages="25--28", issn="1802-4564" }