Publication result detail

Development of the program EOD for design in electron and ion microscopy

ZLÁMAL, J.; LENCOVÁ, B.

Original Title

Development of the program EOD for design in electron and ion microscopy

English Title

Development of the program EOD for design in electron and ion microscopy

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

English abstract

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

Keywords

Finite elementmethod; Tolerancing; User interface

Key words in English

Finite elementmethod; Tolerancing; User interface

Authors

ZLÁMAL, J.; LENCOVÁ, B.

RIV year

2012

Released

21.07.2011

ISBN

0168-9002

Periodical

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Volume

645

Number

1

State

Kingdom of the Netherlands

Pages from

278

Pages to

282

Pages count

5

BibTex

@article{BUT72696,
  author="Jakub {Zlámal} and Bohumila {Lencová}",
  title="Development of the program EOD for design in electron and ion microscopy",
  journal="NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT",
  year="2011",
  volume="645",
  number="1",
  pages="278--282",
  issn="0168-9002"
}