Publication result detail

Temperature Stabilization of Semiconductor Lasers for Direct Measurement of Index of Refraction of Air

MATOUŠEK, V., ČÍP, O.

Original Title

Temperature Stabilization of Semiconductor Lasers for Direct Measurement of Index of Refraction of Air

English Title

Temperature Stabilization of Semiconductor Lasers for Direct Measurement of Index of Refraction of Air

Type

Conference proceedings

Original Abstract

Laser interferometers are even more precise distance measurement devices with resolution in nanometer or sub-nanometer region.

English abstract

Laser interferometers are even more precise distance measurement devices with resolution in nanometer or sub-nanometer region.

Keywords

Temperature stabilization laser index of refraction of air

Key words in English

Temperature stabilization laser index of refraction of air

Authors

MATOUŠEK, V., ČÍP, O.

Released

01.01.2003

Location

BRNO

ISBN

80-214-2379-X

Book

STUDENT EEICT 2003 9th CONFERENCE

Volume

9

Pages from

480

Pages count

5

BibTex

@proceedings{BUT64062,
  editor="Vít {Matoušek} and Ondřej {Číp}",
  title="Temperature Stabilization of Semiconductor Lasers for Direct Measurement of Index of Refraction of Air",
  year="2003",
  number="první",
  pages="5",
  address="BRNO",
  isbn="80-214-2379-X"
}