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HOFEREK, L.; TRIVEDI, R.; MISTRÍK, J.; ČECH, V.
Original Title
Anisotropic film construction using plasma nanotechnology (atomic polymerization)
English Title
Type
Abstract
Original Abstract
Bilayers consisting of a-SiC:H and a-SiOC:H alloys were deposited on silicon wafer using plasma-enhanced chemical vapor deposition (PECVD). The layered structures were subjected to ellipsometric measurements that enabled us to distinguish individual layers and determine the layer thickness and its optical constants. In next study, single layer and multilayered a-SiC:H films, deposited from tetravinylsilane at different powers by PECVD, were investigated intensively by spectroscopic ellipsometry, nanoindentation, and atomic force microscopy (AFM) to compare optical and mechanical properties of the individual layer of decreased thickness (315 - 25 nm) with those of the corresponding single layer.
English abstract
Keywords
plasma polymerization, thin films
Key words in English
Authors
RIV year
2011
Released
27.12.2010
Book
IC-Plants 2010
Pages from
1
Pages to
2
Pages count
Full text in the Digital Library
http://hdl.handle.net/
BibTex
@misc{BUT60975, author="Lukáš {Hoferek} and Rutul Rajendra {Trivedi} and Jan {Mistrík} and Vladimír {Čech}", title="Anisotropic film construction using plasma nanotechnology (atomic polymerization)", booktitle="IC-Plants 2010", year="2010", edition="1", pages="1--2", note="Abstract" }