Mechanical properties of plasma polymer film evaluated by conventional and alternative nanoindentation techniques

Mechanical properties of plasma polymer film evaluated by conventional and alternative nanoindentation techniques

Abstract

A plasma-polymerized tetravinylsilane film of about 1 micron thickness was prepared under steady-state deposition conditions on polished silicon wafer using plasma-enhanced chemical vapor deposition. Near-surface mechanical properties such as the reduced modulus and hardness of the plasma polymer film were investigated using the conventional depth-sensing nanoindentation technique as well as the load-partial-unload (cyclic) nanoindentation technique. The study found an influence of the dwell time and loading/unloading rate on the determined values of the reduced modulus, hardness, and contact depth.

A plasma-polymerized tetravinylsilane film of about 1 micron thickness was prepared under steady-state deposition conditions on polished silicon wafer using plasma-enhanced chemical vapor deposition. Near-surface mechanical properties such as the reduced modulus and hardness of the plasma polymer film were investigated using the conventional depth-sensing nanoindentation technique as well as the load-partial-unload (cyclic) nanoindentation technique. The study found an influence of the dwell time and loading/unloading rate on the determined values of the reduced modulus, hardness, and contact depth.

plasma polymerization; thin films; nanoindentation

plasma polymerization; thin films; nanoindentation

TRIVEDI, R.; ČECH, V.

2010

22.12.2009

Book of Abstracts, 7th AEPSE 2009, Busan

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