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Petr Běťák
Original Title
Advanced tunable protective structure against electrostatic discharge
English Title
Type
Abstract
Original Abstract
New advanced SCR structures provide ESD characteristics adjustibility to be optimal for certain application. Optimal adjustment of silicon active areas dimensions is necessary to simulate by computer aided design systems (TCAD). Then can be uniquely determined which features will be given by certain dimensions setting. For applications with different requirements might be various geometrical masks of one structure produced and by this way to meet with defined requirements only using different type of mask.
English abstract
Keywords
ESD, SCR, electrostatic discharge, silicon controlled rectifier
Key words in English
Authors
Released
01.01.2007
ISBN
978-973-713-174-4
Book
ISSE 2007 30th International Spring Seminar on Electronics Technology 2007
Pages from
238
Pages count
2
BibTex
@misc{BUT60524, author="Petr {Běťák}", title="Advanced tunable protective structure against electrostatic discharge", booktitle="ISSE 2007 30th International Spring Seminar on Electronics Technology 2007", year="2007", pages="2", isbn="978-973-713-174-4", note="Abstract" }