Publication result detail

Non-destructive Testing of Luminescent Diodes by Noise

KOKTAVÝ, P., ŠIKULA, J.

Original Title

Non-destructive Testing of Luminescent Diodes by Noise

English Title

Non-destructive Testing of Luminescent Diodes by Noise

Type

Paper in proceedings (conference paper)

Original Abstract

Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Results of microplasma noise studying may be used for p-n junction non-destructive diagnostics and quality assessment.

English abstract

Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Results of microplasma noise studying may be used for p-n junction non-destructive diagnostics and quality assessment.

Keywords

Luminiscent Diode, LED, Microplasma, Noise, Reliability

Key words in English

Luminiscent Diode, LED, Microplasma, Noise, Reliability

Authors

KOKTAVÝ, P., ŠIKULA, J.

RIV year

2011

Released

01.01.2002

Publisher

European Federation for Non-Destructive Testing

Location

Madrid

ISBN

84-699-8573-6

Book

8-th ECNDT

Pages from

247

Pages count

1

BibTex

@inproceedings{BUT5702,
  author="Pavel {Koktavý} and Josef {Šikula}",
  title="Non-destructive Testing of Luminescent Diodes by Noise",
  booktitle="8-th ECNDT",
  year="2002",
  number="1.",
  pages="1",
  publisher="European Federation for Non-Destructive Testing",
  address="Madrid",
  isbn="84-699-8573-6"
}