Publication result detail

Interactive Tool for Behavioral Level Testability Analysis

KOTÁSEK, Z.; STRNADEL, J.; RŮŽIČKA, R.; HLAVIČKA, J.

Original Title

Interactive Tool for Behavioral Level Testability Analysis

English Title

Interactive Tool for Behavioral Level Testability Analysis

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

The paper presents a method of system-level testability analysis based on the study of relationship between different HLL constructs and their implementation in the structure of the resulting circuit. The observations made when analyzing the function of a professional design tool are then generalized and used for the formulation of system-level testable design guidelines. This feedback, although very useful, is provided only by some design tools, therefore it has been implemented in a program product IBLA (Interactive Tool for Behavioral Level Testability Analysis) presented in this paper.

English abstract

The paper presents a method of system-level testability analysis based on the study of relationship between different HLL constructs and their implementation in the structure of the resulting circuit. The observations made when analyzing the function of a professional design tool are then generalized and used for the formulation of system-level testable design guidelines. This feedback, although very useful, is provided only by some design tools, therefore it has been implemented in a program product IBLA (Interactive Tool for Behavioral Level Testability Analysis) presented in this paper.

Keywords

behavioral testability analysis

Key words in English

behavioral testability analysis

Authors

KOTÁSEK, Z.; STRNADEL, J.; RŮŽIČKA, R.; HLAVIČKA, J.

Released

05.12.2001

Location

Stockholm

Book

Proceedings of the IEEE ETW 2001

Pages from

117

Pages to

119

Pages count

3

BibTex

@inproceedings{BUT5609,
  author="Zdeněk {Kotásek} and Josef {Strnadel} and Richard {Růžička} and Jan {Hlavička}",
  title="Interactive Tool for Behavioral Level Testability Analysis",
  booktitle="Proceedings of the IEEE ETW 2001",
  year="2001",
  pages="117--119",
  address="Stockholm"
}