Publication result detail

An ellipsometric study of W thin films deposited on Si

Deineka AG, Tarasenko AA, Jastrabik L, Chvostova D, Bousek J

Original Title

An ellipsometric study of W thin films deposited on Si

English Title

An ellipsometric study of W thin films deposited on Si

Type

Peer-reviewed article not indexed in WoS or Scopus

Authors

Deineka AG, Tarasenko AA, Jastrabik L, Chvostova D, Bousek J

Released

10.02.1999

Publisher

Elsevier

ISBN

0040-6090

Periodical

Thin Solid Films

Volume

Volume 339

Number

1-2

State

Kingdom of the Netherlands

Pages from

216

Pages to

219

Pages count

4

BibTex

@article{BUT50574,
  author="Jaroslav {Boušek}",
  title="An ellipsometric study of W thin films deposited on Si",
  journal="Thin Solid Films",
  year="1999",
  volume="Volume 339",
  number="1-2",
  pages="216--219",
  issn="0040-6090"
}