Publication result detail

Noise spectroscopy of shallow traps in CdTe crystals

SCHAUER, P.

Original Title

Noise spectroscopy of shallow traps in CdTe crystals

English Title

Noise spectroscopy of shallow traps in CdTe crystals

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

We introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors.

English abstract

We introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors.

Keywords

noise, traps, spectroscopy, CdTE

Key words in English

noise, traps, spectroscopy, CdTE

Authors

SCHAUER, P.

RIV year

2011

Released

09.11.2010

Publisher

ZČU

Location

Plzeň, Czech Republic

ISBN

1802-4564

Periodical

ElectroScope - http://www.electroscope.zcu.cz

Volume

2010

Number

3

State

Czech Republic

Pages from

55

Pages to

59

Pages count

5

BibTex

@article{BUT50551,
  author="Pavel {Schauer}",
  title="Noise spectroscopy of shallow traps in CdTe crystals",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2010",
  volume="2010",
  number="3",
  pages="55--59",
  issn="1802-4564"
}