Publication result detail

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Original Title

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Type

Paper in proceedings (conference paper)

Original Abstract

Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.

English abstract

Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.

Key words in English

Noise, contact, spectroscopy

Authors

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Released

17.09.2002

Location

Prague

ISBN

80-01-02579-9

Book

Physical and Material Engineering 2002

Pages from

121

Pages count

2

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@inproceedings{BUT5020,
  author="Jiří {Vaněk} and Radim {Bařinka} and Zdeněk {Chobola}",
  title="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools",
  booktitle="Physical and Material Engineering 2002",
  year="2002",
  pages="2",
  address="Prague",
  isbn="80-01-02579-9"
}