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ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; SMITH, S.
Original Title
Microscale localization of low light emitting spots in reversed-biased silicon solar cells
English Title
Type
WoS Article
Original Abstract
We present the results of an investigation of the sub-micron irregularities in a monocrystalline silicon solar cell structure utilizing scanning near-field microscopy. The experiments rely on the fact that silicon solar cells under reverse bias exhibit micron-scale low-light emitting centers. A novel method allowing simultaneous localization and measurement of this light on the microscale is presented. The method allows the characterization of these irregularities with high spatial resolution.
English abstract
Keywords
solar cell, defect, light emission, scanning probe microscope, microscale, localization
Key words in English
Authors
RIV year
2011
Released
09.09.2010
Publisher
Elsevier
Location
North-Holland
ISBN
0927-0248
Periodical
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume
94
Number
12
State
Kingdom of the Netherlands
Pages from
2358
Pages to
2361
Pages count
4
BibTex
@article{BUT49808, author="Pavel {Škarvada} and Pavel {Tománek} and Lubomír {Grmela} and Steve J. {Smith}", title="Microscale localization of low light emitting spots in reversed-biased silicon solar cells", journal="SOLAR ENERGY MATERIALS AND SOLAR CELLS", year="2010", volume="94", number="12", pages="2358--2361", issn="0927-0248" }