Publication result detail

Process Characterization and Description in Order to Reliability Assessment

NOVOTNÝ, R.

Original Title

Process Characterization and Description in Order to Reliability Assessment

English Title

Process Characterization and Description in Order to Reliability Assessment

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

English abstract

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

Keywords

analysis, variation, quantification, experiment, optimization, factor, response, design

Key words in English

analysis, variation, quantification, experiment, optimization, factor, response, design

Authors

NOVOTNÝ, R.

RIV year

2010

Released

01.01.2008

Publisher

Naun.org

ISBN

1998-4464

Periodical

International Journal of Circuits Systems and Signal Processing

Volume

2007

Number

4

State

United States of America

Pages from

303

Pages to

309

Pages count

7

BibTex

@article{BUT49207,
  author="Radovan {Novotný}",
  title="Process Characterization and Description in Order to Reliability Assessment",
  journal="International Journal of Circuits Systems and Signal Processing",
  year="2008",
  volume="2007",
  number="4",
  pages="303--309",
  issn="1998-4464"
}