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LENCOVÁ, B.; ZLÁMAL, J.
Original Title
A new program for the design of electron microscopes
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.
English abstract
Keywords
Finite element method; Electron lenses and deflectors; Computer-aided design; User interface
Key words in English
Authors
RIV year
2010
Released
29.08.2008
Publisher
Elsevier
ISBN
1875-3892
Periodical
Physics Procedia
Volume
1
Number
State
Kingdom of the Netherlands
Pages from
315
Pages to
324
Pages count
10
BibTex
@article{BUT48562, author="Bohumila {Lencová} and Jakub {Zlámal}", title="A new program for the design of electron microscopes", journal="Physics Procedia", year="2008", volume="1", number="1", pages="315--324", issn="1875-3892" }