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OHLÍDAL, M.; OHLÍDAL, I.; KLAPETEK, P.; NEČAS, D.; BURŠÍKOVÁ, V.
Original Title
Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
English Title
Type
WoS Article
Original Abstract
Complete optical characterization of diamond-like carbon films non-uniform in thickness is performed usig spectroscopic imaging reflectometry. It is shown that by using this technique it is possible to determine the distributions of the refractive index, extinction coefficient and thickness (with arbitrary shape of the thickness non-uniformity) of these films.
English abstract
Keywords
spectroscopic imaging reflectometry, diamond-like carbon films, optical analysis
Key words in English
Authors
RIV year
2012
Released
31.01.2009
Publisher
Elsevier
Location
LAUSANNE
ISBN
0925-9635
Periodical
DIAMOND AND RELATED MATERIALS
Volume
2009 (18)
Number
1
State
Kingdom of the Netherlands
Pages from
384
Pages to
387
Pages count
4
BibTex
@article{BUT48065, author="Miloslav {Ohlídal} and Ivan {Ohlídal} and Petr {Klapetek} and David {Nečas} and Vilma {Buršíková}", title="Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films", journal="DIAMOND AND RELATED MATERIALS", year="2009", volume="2009 (18)", number="1", pages="384--387", issn="0925-9635" }