Publication result detail

Near-field scanning optical microscope probe analysis

KLAPETEK, P.; BURŠÍK, J.; MARTINEK, J.

Original Title

Near-field scanning optical microscope probe analysis

English Title

Near-field scanning optical microscope probe analysis

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.

English abstract

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.

Keywords

NSOM, artifacts

Key words in English

NSOM, artifacts

Authors

KLAPETEK, P.; BURŠÍK, J.; MARTINEK, J.

Released

12.11.2007

ISBN

0304-3991

Periodical

ULTRAMICROSCOPY

Volume

2007

Number

1

State

Kingdom of the Netherlands

Pages from

1

Pages to

1

Pages count

4

BibTex

@article{BUT44372,
  author="Petr {Klapetek} and Jiří {Buršík} and Jan {Martinek}",
  title="Near-field scanning optical microscope probe analysis",
  journal="ULTRAMICROSCOPY",
  year="2007",
  volume="2007",
  number="1",
  pages="1--1",
  issn="0304-3991"
}