Detail publikačního výsledku

PROBLEMS INVOLVED IN AN ANALYSING NANOMATERIALS USING STANDARD INSTRUMENTS

ŠVEJCAR, J.

Original Title

PROBLEMS INVOLVED IN AN ANALYSING NANOMATERIALS USING STANDARD INSTRUMENTS

English Title

PROBLEMS INVOLVED IN AN ANALYSING NANOMATERIALS USING STANDARD INSTRUMENTS

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

In the present paper, attention is focused on the relatively universal methods with a wide range of applicability in the study of structure aspects. The aim of the paper is not describing these methods (general knowledge of their principle is assumed) but pointing at some of their limitations and pitfalls that can appear in the study of nanobjects (in contrast with their current application in the micro-or mezo-regions).

English abstract

In the present paper, attention is focused on the relatively universal methods with a wide range of applicability in the study of structure aspects. The aim of the paper is not describing these methods (general knowledge of their principle is assumed) but pointing at some of their limitations and pitfalls that can appear in the study of nanobjects (in contrast with their current application in the micro-or mezo-regions).

Keywords

electron microscopy and microanalysis, nanostructured materials, X-Ray diffraction

Key words in English

electron microscopy and microanalysis, nanostructured materials, X-Ray diffraction

Authors

ŠVEJCAR, J.

Released

01.02.2007

Location

Košice

ISBN

1335-1532

Periodical

Acta Metallurgica Slovaca

Volume

13

Number

2

State

Slovak Republic

Pages from

214

Pages to

222

Pages count

8

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@article{BUT43460,
  author="Jiří {Švejcar}",
  title="PROBLEMS INVOLVED IN AN ANALYSING NANOMATERIALS USING STANDARD INSTRUMENTS",
  journal="Acta Metallurgica Slovaca",
  year="2007",
  volume="13",
  number="2",
  pages="214--222",
  issn="1335-1532"
}