Publication result detail

Very Low Energy Scanning Electron Microscope

HRNČIŘÍK, P., MULLEROVÁ, I.

Original Title

Very Low Energy Scanning Electron Microscope

English Title

Very Low Energy Scanning Electron Microscope

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

An ultrahigh vacuum Scanning Electron Microscope with a Schottky field emission gun for surface analysis has been finished. The microscope is adapted to Auger spectroscopy and spectromicroscopy, SLEEM (Scanning Low Energy Electron Microscopy) and SLETEM (Scanning Low Energy Transmission Electron Microscopy).

English abstract

An ultrahigh vacuum Scanning Electron Microscope with a Schottky field emission gun for surface analysis has been finished. The microscope is adapted to Auger spectroscopy and spectromicroscopy, SLEEM (Scanning Low Energy Electron Microscopy) and SLETEM (Scanning Low Energy Transmission Electron Microscopy).

Key words in English

SLEEM, SLETEM, SEM, UHV

Authors

HRNČIŘÍK, P., MULLEROVÁ, I.

Released

01.01.2004

ISBN

1439-4243

Periodical

GIT Imaging&Microscopy

Volume

6

Number

4

State

Federal Republic of Germany

Pages from

47

Pages count

3

Full text in the Digital Library

BibTex

@article{BUT42285,
  author="Petr {Hrnčiřík} and Ilona {Müllerová}",
  title="Very Low Energy Scanning Electron Microscope",
  journal="GIT Imaging&Microscopy",
  year="2004",
  volume="6",
  number="4",
  pages="3",
  issn="1439-4243"
}