Publication result detail

Monitoring of surface homogeneity of optical parameters of thin films.

URBÁNEK, M., ŠIKOLA, T., NEBOJSA, A., SPOUSTA, J., DITTRICHOVÁ, L., CHMELÍK, R., ZLÁMAL, J., JIRUŠE, J.

Original Title

Monitoring of surface homogeneity of optical parameters of thin films.

English Title

Monitoring of surface homogeneity of optical parameters of thin films.

Type

Paper in proceedings (conference paper)

Original Abstract

Monitoring of surface homogeneity of optical parameters of thin films

English abstract

Monitoring of surface homogeneity of optical parameters of thin films

Key words in English

thin films

Authors

URBÁNEK, M., ŠIKOLA, T., NEBOJSA, A., SPOUSTA, J., DITTRICHOVÁ, L., CHMELÍK, R., ZLÁMAL, J., JIRUŠE, J.

Released

17.04.2000

Publisher

Editors: B. Michel, T. Winkler, M. Werner,H. Fecht

Location

Berlin

Book

Micromat 2000

Pages from

604

Pages count

6

BibTex

@inproceedings{BUT4155,
  author="Michal {Urbánek} and Tomáš {Šikola} and Alois {Nebojsa} and Jiří {Spousta} and Libuše {Dittrichová} and Radim {Chmelík} and Jakub {Zlámal} and Jaroslav {Jiruše}",
  title="Monitoring of surface homogeneity of optical parameters of thin films.",
  booktitle="Micromat 2000",
  year="2000",
  pages="6",
  publisher="Editors: B. Michel, T. Winkler, M. Werner,H. Fecht",
  address="Berlin"
}