Publication result detail

Noise as a tool for non-destructive testing of signle-crystal silicon solar cells

CHOBOLA, Z.

Original Title

Noise as a tool for non-destructive testing of signle-crystal silicon solar cells

English Title

Noise as a tool for non-destructive testing of signle-crystal silicon solar cells

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

Transport and noise characteristics of forward and reverse biased single-crystal silicon solar cellswere measured in order to evaluiate the solar cell technology.

English abstract

Transport and noise characteristics of forward and reverse biased single-crystal silicon solar cellswere measured in order to evaluiate the solar cell technology.

Key words in English

Noise, non-destructive testing

Authors

CHOBOLA, Z.

Released

21.08.2001

ISBN

0026-2692

Periodical

MICROELECTRONICS JOURNAL

Volume

2001

Number

8

State

United Kingdom of Great Britain and Northern Ireland

Pages from

1947

Pages count

6

BibTex

@article{BUT40584,
  author="Zdeněk {Chobola}",
  title="Noise as a tool for non-destructive testing of signle-crystal silicon solar cells",
  journal="MICROELECTRONICS JOURNAL",
  year="2001",
  volume="2001",
  number="8",
  pages="6",
  issn="0026-2692"
}