Publication result detail

Noise and scanning by local illumination as reliability estimation for silicon solar cells

CHOBOLA, Z., IBRAHIM, A.

Original Title

Noise and scanning by local illumination as reliability estimation for silicon solar cells

English Title

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

English abstract

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Key words in English

Solar cells, noise, homogeneity, reliability

Authors

CHOBOLA, Z., IBRAHIM, A.

Released

16.03.2001

ISBN

0219-4775

Periodical

FLUCTUATION AND NOISE LETTERS

Volume

1

Number

1

State

Republic of Singapore

Pages from

L21

Pages count

6