Publication result detail

Stress Testing in the Evaluation the Reliability of Electronic Devices

NOVOTNÝ, R.

Original Title

Stress Testing in the Evaluation the Reliability of Electronic Devices

English Title

Stress Testing in the Evaluation the Reliability of Electronic Devices

Type

Paper in proceedings (conference paper)

Original Abstract

Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.

English abstract

Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.

Keywords

reliability, environmental tests, hazard rate model, burn-in

Key words in English

reliability, environmental tests, hazard rate model, burn-in

Authors

NOVOTNÝ, R.

Released

01.01.2001

Publisher

Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105

Location

Crete 2001

ISBN

80-214-2027-8

Book

Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings

Pages from

253

Pages count

5

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@inproceedings{BUT3858,
  author="Radovan {Novotný}",
  title="Stress Testing in the Evaluation the Reliability of Electronic Devices",
  booktitle="Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings",
  year="2001",
  number="1",
  pages="5",
  publisher="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105",
  address="Crete 2001",
  isbn="80-214-2027-8"
}