Publication result detail

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

IBRAHIM, A., ŠIKULA, J., CHOBOLA, Z.

Original Title

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

English Title

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

Type

Paper in proceedings (conference paper)

Original Abstract

Both non-linearity measurements by Third Harmonic Index (THI) and Low Frequency Noise (LFN) techniques being taking as a measure of the reliability for a semiconductor device such as silicon solar cell.

English abstract

Both non-linearity measurements by Third Harmonic Index (THI) and Low Frequency Noise (LFN) techniques being taking as a measure of the reliability for a semiconductor device such as silicon solar cell.

Key words in English

Noise, quality, silicon solar cells

Authors

IBRAHIM, A., ŠIKULA, J., CHOBOLA, Z.

Released

22.10.2001

Publisher

University of Florida

Location

Gainesville, Florida, USA

Book

Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001

Pages from

739

Pages count

4

BibTex

@inproceedings{BUT3720,
  author="Ali {Ibrahim} and Josef {Šikula} and Zdeněk {Chobola}",
  title="Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells",
  booktitle="Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001",
  year="2001",
  pages="4",
  publisher="University of Florida",
  address="Gainesville, Florida, USA"
}