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ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.
Original Title
Light emission from silicon solar cells as characterization technique
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
The paper describes local photoelectric measurement results obtained with monocrystalline silicon solar cell in visible light. The measurement allows localize, with high spatial resolution, a weak light emission from defects at reverse bias voltage as low as 3 V, which does not exhibit any relation to current-voltage characteristics (no local breakdowns). Other types of defects observed under forward bias using electroluminescence (EL) and light induced beam current (LBIC) techniques are also visualized. The measurements should contribute to find a correlation between EL and modified LBIC results.
English abstract
Keywords
silicon solar cell; characterization; light emission; defects
Key words in English
Authors
RIV year
2011
Released
19.05.2010
Publisher
Reprotechnika Wroclaw
Location
Wroclaw
ISBN
978-1-4244-5371-9
Book
2010 9th International Conference on Environment and Electrical Engineering
Pages from
97
Pages to
100
Pages count
4
BibTex
@inproceedings{BUT35588, author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Robert {Macků}", title="Light emission from silicon solar cells as characterization technique", booktitle="2010 9th International Conference on Environment and Electrical Engineering", year="2010", pages="97--100", publisher="Reprotechnika Wroclaw", address="Wroclaw", isbn="978-1-4244-5371-9" }