Publication result detail

The Measurement of Temperature Characteristics of Cu Bulk Resistivity

BARTUŠEK, K.; FIALA, P.; DOHNAL, P.

Original Title

The Measurement of Temperature Characteristics of Cu Bulk Resistivity

English Title

The Measurement of Temperature Characteristics of Cu Bulk Resistivity

Type

Paper in proceedings (conference paper)

Original Abstract

This contribution contain a presentation of a results of the numerical modeling during design of measurement method for determine of thermal characteristic of specific resistance of Cu bulk. Combine of numerical modeling and experimental verification brings very effective procedure during suggestion and application in cryogenic region. Results of this work are used in research activities of Czech Academy of Science, ISI-Brno.

English abstract

This contribution contain a presentation of a results of the numerical modeling during design of measurement method for determine of thermal characteristic of specific resistance of Cu bulk. Combine of numerical modeling and experimental verification brings very effective procedure during suggestion and application in cryogenic region. Results of this work are used in research activities of Czech Academy of Science, ISI-Brno.

Keywords

resistivity, temperature dependence of resistivity, Kelvins probe, cryotechnics

Key words in English

resistivity, temperature dependence of resistivity, Kelvins probe, cryotechnics

Authors

BARTUŠEK, K.; FIALA, P.; DOHNAL, P.

RIV year

2010

Released

06.07.2008

Publisher

The Electromagnetic academy

Location

Cambridge

ISBN

978-1-934142-06-6

Book

Progress in Electromagnetics Research Symposium (PIERS 2008)

ISBN

1559-9450

Periodical

Progress In Electromagnetics

Volume

2008

Number

2

State

United States of America

Pages from

764

Pages to

768

Pages count

5

BibTex

@inproceedings{BUT34551,
  author="Karel {Bartušek} and Pavel {Fiala} and Přemysl {Dohnal}",
  title="The Measurement of Temperature Characteristics of Cu Bulk Resistivity",
  booktitle="Progress in Electromagnetics Research Symposium (PIERS 2008)",
  year="2008",
  journal="Progress In Electromagnetics",
  volume="2008",
  number="2",
  pages="764--768",
  publisher="The Electromagnetic academy",
  address="Cambridge",
  isbn="978-1-934142-06-6",
  issn="1559-9450"
}