Publication result detail

Loss in the near-field optical microscopy due to the tapered probe

TOMÁNEK, P.; ŠKARVADA, P.

Original Title

Loss in the near-field optical microscopy due to the tapered probe

English Title

Loss in the near-field optical microscopy due to the tapered probe

Type

Paper in proceedings (conference paper)

Original Abstract

Near-field optical techniques are presently widely used to study various optical characteristics of transparent or opaque microscopic structures such as optical waveguides, photonic crystals, semiconductor junctions, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered tiny optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source, detector, or both. Therefore it must be protected against mechanical vibration, cracks, etc. For its accurate simulation, it is essential that its geometry is correctly described, especially when coupling to evanescent field is considered.

English abstract

Near-field optical techniques are presently widely used to study various optical characteristics of transparent or opaque microscopic structures such as optical waveguides, photonic crystals, semiconductor junctions, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered tiny optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source, detector, or both. Therefore it must be protected against mechanical vibration, cracks, etc. For its accurate simulation, it is essential that its geometry is correctly described, especially when coupling to evanescent field is considered.

Keywords

near field, optics, taper, dielectric coating

Key words in English

near field, optics, taper, dielectric coating

Authors

TOMÁNEK, P.; ŠKARVADA, P.

RIV year

2010

Released

15.10.2009

Publisher

Technical University Košice

Location

Košice, Slovensko

ISBN

978-80-8086-122-3

Book

Proceedings Physics of Materials 09

Pages from

119

Pages to

122

Pages count

4

BibTex

@inproceedings{BUT32400,
  author="Pavel {Tománek} and Pavel {Škarvada}",
  title="Loss in the near-field optical microscopy due to the tapered probe",
  booktitle="Proceedings Physics of Materials 09",
  year="2009",
  pages="119--122",
  publisher="Technical University Košice",
  address="Košice, Slovensko",
  isbn="978-80-8086-122-3"
}