Publication result detail

Modeling of Current Density in Thick Film Resistors

PULEC, J.; SZENDIUCH, I.

Original Title

Modeling of Current Density in Thick Film Resistors

English Title

Modeling of Current Density in Thick Film Resistors

Type

Paper in proceedings (conference paper)

Original Abstract

This paper describes various methods for setting of desirable value of resistance in thick film resistors. In this ways adjusted resistors are next created and analyzed in view of maximum current density in them. Methods are compared and it is selected the optimal from them.

English abstract

This paper describes various methods for setting of desirable value of resistance in thick film resistors. In this ways adjusted resistors are next created and analyzed in view of maximum current density in them. Methods are compared and it is selected the optimal from them.

Keywords

thick film technology, current density, relibility, simulation

Key words in English

thick film technology, current density, relibility, simulation

Authors

PULEC, J.; SZENDIUCH, I.

RIV year

2011

Released

29.04.2010

Publisher

NOVPRESS

Location

Brno

ISBN

978-80-214-4079-1

Book

STUDENT EEICT 2010

Pages from

236

Pages to

240

Pages count

5

BibTex

@inproceedings{BUT29968,
  author="Jiří {Pulec} and Ivan {Szendiuch}",
  title="Modeling of Current Density in Thick Film Resistors",
  booktitle="STUDENT EEICT 2010",
  year="2010",
  number="1",
  pages="236--240",
  publisher="NOVPRESS",
  address="Brno",
  isbn="978-80-214-4079-1"
}