Přístupnostní navigace
E-application
Search Search Close
Detail publikačního výsledku
ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P.
Original Title
Nanooptics of locally induced photocurrent in Si solar cells
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
This paper is intended to present the results of our experimental study of local defect in silicon solar cells. Solar cells defects are evaluated by Near-field optical induced photocurrent, scanning near-field optical microscope characterization and noise spectroscopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of breakdown. All type of noise - thermal, shot, generation, recombination and 1/f type of noise play a different role in reliability analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM, NOBIC and noise spectroscopy represent the coupling of very useful methods to provide a non-destructive characterization on silicon semiconductor solar cells.
English abstract
Keywords
monocrystalline Si, solar cell, locally induced photocurrent
Key words in English
Authors
RIV year
2010
Released
27.08.2008
Publisher
Zeithamlová Milena, Ing. - Agentura Action M
Location
Prague
ISBN
978-80-86742-25-0
Book
Photonics Prague 2008
Pages from
96
Pages to
97
Pages count
2
Full text in the Digital Library
http://hdl.handle.net/
BibTex
@inproceedings{BUT27320, author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}", title="Nanooptics of locally induced photocurrent in Si solar cells", booktitle="Photonics Prague 2008", year="2008", pages="96--97", publisher="Zeithamlová Milena, Ing. - Agentura Action M", address="Prague", isbn="978-80-86742-25-0" }