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MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.
Original Title
Study of solar cells I-V chracteristics behaviour in wide range of temperature
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
This article is focused on single-crystal silicon solar cells study. The function of solar cell could be affected by many defects e.g. dislocations or impurities in silicon. These defects are often local and can result in lower efficiency or shorter solar cell lifetime. Consequently, we can observe many of defects in electric characteristics of solar cells. Measured IV-characteristics and noise signals provide information for defects classification and/or identification. The results of two basic types of the silicon solar cells measuring at very low temperatures are presented in this paper. Used types of solar cells differ in surface texturing. A cryogenic system with wide range of regulated temperatures is used for this measuring. The microscopic study results of samples surface scanning are also presented.
English abstract
Keywords
Solar cell, I-V characteristic, recombination, SNOM, noise
Key words in English
Authors
RIV year
2010
Released
10.09.2008
Publisher
Brno University of Technology
Location
Brno
ISBN
978-80-214-3717-3
Book
Electronic Devices and Systems EDS08
Pages from
120
Pages to
125
Pages count
6
BibTex
@inproceedings{BUT26960, author="Robert {Macků} and Pavel {Koktavý} and Pavel {Škarvada}", title="Study of solar cells I-V chracteristics behaviour in wide range of temperature", booktitle="Electronic Devices and Systems EDS08", year="2008", number="1", pages="120--125", publisher="Brno University of Technology", address="Brno", isbn="978-80-214-3717-3" }