Publication result detail

Passivation quality test by noise method

VANĚK, J.; KAZELLE, J.; CHOBOLA, Z.; JURÁNKOVÁ, V.

Original Title

Passivation quality test by noise method

English Title

Passivation quality test by noise method

Type

Paper in proceedings (conference paper)

Original Abstract

Transport and noise characteristic of forward biased monocrystalline silicon solar cells made by different passivation method were measured in order to evaluate new technology:

English abstract

Transport and noise characteristic of forward biased monocrystalline silicon solar cells made by different passivation method were measured in order to evaluate new technology:

Keywords

noise characteristic

Key words in English

noise characteristic

Authors

VANĚK, J.; KAZELLE, J.; CHOBOLA, Z.; JURÁNKOVÁ, V.

Released

14.09.2006

Publisher

Ing.Zdeněk Novotný,CSc.

Location

Brno

ISBN

80-214-3246-2

Book

Electronic Devices and Systems

Pages from

175

Pages to

178

Pages count

4

BibTex

@inproceedings{BUT25071,
  author="Jiří {Vaněk} and Jiří {Kazelle} and Zdeněk {Chobola} and Vlasta {Juránková}",
  title="Passivation quality test by noise method",
  booktitle="Electronic Devices and Systems",
  year="2006",
  pages="175--178",
  publisher="Ing.Zdeněk Novotný,CSc.",
  address="Brno",
  isbn="80-214-3246-2"
}