Publication result detail

Test Scheduling for SOC under Power Constraints

ŠKARVADA, J.

Original Title

Test Scheduling for SOC under Power Constraints

English Title

Test Scheduling for SOC under Power Constraints

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

The paper deals with test scheduling under power constraints for SOC. An approach based on genetic algorithm operating on Test Application Conflict Graph is presented. The main goal of the method is to minimize test application time with considering structural resource allocation conflicts and to ensure that test application schedule does not exceed chip power limits. The proposed method was implemented using C++, experimental results with ITC'02 SOC benchmark suite are presented in the paper together with the perspectives for the future research.

English abstract

The paper deals with test scheduling under power constraints for SOC. An approach based on genetic algorithm operating on Test Application Conflict Graph is presented. The main goal of the method is to minimize test application time with considering structural resource allocation conflicts and to ensure that test application schedule does not exceed chip power limits. The proposed method was implemented using C++, experimental results with ITC'02 SOC benchmark suite are presented in the paper together with the perspectives for the future research.

Keywords

test scheduling, power constraint, test application conflict graph, genetic algorithm

Key words in English

test scheduling, power constraint, test application conflict graph, genetic algorithm

Authors

ŠKARVADA, J.

Released

20.04.2006

Publisher

Czech Technical University Publishing House

Location

Prague

ISBN

1-4244-0184-4

Book

Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Pages from

91

Pages to

93

Pages count

3

BibTex

@inproceedings{BUT22187,
  author="Jaroslav {Škarvada}",
  title="Test Scheduling for SOC under Power Constraints",
  booktitle="Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems",
  year="2006",
  pages="91--93",
  publisher="Czech Technical University Publishing House",
  address="Prague",
  isbn="1-4244-0184-4"
}