Detail publikačního výsledku

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

KOTÁSEK, Z.; STRNADEL, J.

Original Title

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

English Title

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

English abstract

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

Keywords

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Key words in English

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Authors

KOTÁSEK, Z.; STRNADEL, J.

Released

31.03.2006

Publisher

IEEE Computer Society

Location

Los Alamitos, CA

ISBN

0-7695-2546-6

Book

Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)

Pages from

497

Pages to

498

Pages count

2

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@inproceedings{BUT22181,
  author="Zdeněk {Kotásek} and Josef {Strnadel}",
  title="SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System",
  booktitle="Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)",
  year="2006",
  pages="497--498",
  publisher="IEEE Computer Society",
  address="Los Alamitos, CA",
  isbn="0-7695-2546-6"
}