Publication result detail

Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.

MÜLLEROVÁ, I.; KONVALINA, I.; POKORNÁ, Z.

Original Title

Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.

English Title

Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.

Type

Paper in proceedings (conference paper)

Original Abstract

New eight-channel detector for acquisition of the angular distribution of backscattered electrons has been designed and tested. The detector is based on a multi-channel plate followed by eight concentric circular collectors centered to the optical axis. High collection efficiency and high amplification of the detector down to 100 eV of emission energy is secured by action of the cathode lens. In first experiments the detector has proved itself useful for imaging of polycrystalline structures.

English abstract

New eight-channel detector for acquisition of the angular distribution of backscattered electrons has been designed and tested. The detector is based on a multi-channel plate followed by eight concentric circular collectors centered to the optical axis. High collection efficiency and high amplification of the detector down to 100 eV of emission energy is secured by action of the cathode lens. In first experiments the detector has proved itself useful for imaging of polycrystalline structures.

Keywords

multi-channel detector, angular distribution, low energy electron microscope

Key words in English

multi-channel detector, angular distribution, low energy electron microscope

Authors

MÜLLEROVÁ, I.; KONVALINA, I.; POKORNÁ, Z.

Released

11.09.2006

Location

Toyama

ISBN

4-9903248-0-3

Book

6th Japanese-Polish Joint Seminar on Materials Analysis

Pages from

13

Pages count

2

BibTex

@inproceedings{BUT21728,
  author="Ilona {Müllerová} and Ivo {Konvalina} and Zuzana {Pokorná}",
  title="Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.",
  booktitle="6th Japanese-Polish Joint Seminar on Materials Analysis",
  year="2006",
  pages="2",
  address="Toyama",
  isbn="4-9903248-0-3"
}