Publication result detail

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

RŮŽIČKA, R.

Original Title

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

English Title

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.

English abstract

In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.

Keywords

RT level diagnostics, i paths, design-for-testability

Key words in English

RT level diagnostics, i paths, design-for-testability

Authors

RŮŽIČKA, R.

Released

23.05.2005

Publisher

Tallinn University of Technology

Location

Tallinn

Book

Informal Digest of Papers of the IEEE European Test Symposium 2005

Pages from

156

Pages to

157

Pages count

2

BibTex

@inproceedings{BUT21509,
  author="Richard {Růžička}",
  title="A Complex Approach to Digital RTL Circuit Testability - iFCoRT System",
  booktitle="Informal Digest of Papers of the IEEE European Test Symposium 2005",
  year="2005",
  pages="156--157",
  publisher="Tallinn University of Technology",
  address="Tallinn"
}