Publication result detail

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

BENEŠOVÁ, M., TOMÁNEK, P., LIŠKA, M.

Original Title

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

English Title

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

Type

Paper in proceedings (conference paper)

Original Abstract

Images obtained in Scanning near-field optical microscopy (SNOM) depend strongly on the experimental conditions. The theoretical model taking into account a complex structure of samples (multilayers) and a general tip geometry is introduced. This model can be applied to the different SNOM configurations and for various sampéle-electromagnetic coupling factors.

English abstract

Images obtained in Scanning near-field optical microscopy (SNOM) depend strongly on the experimental conditions. The theoretical model taking into account a complex structure of samples (multilayers) and a general tip geometry is introduced. This model can be applied to the different SNOM configurations and for various sampéle-electromagnetic coupling factors.

Keywords

resolution, sample coating, local probe, scanning near field optical microscopy

Key words in English

resolution, sample coating, local probe, scanning near field optical microscopy

Authors

BENEŠOVÁ, M., TOMÁNEK, P., LIŠKA, M.

Released

19.10.2000

Publisher

Slovenská technická univerzita v Bratislave

Location

Bratislava

ISBN

80-227-1413-5

Book

CO-MAT-TECH 2000, 8. Medzinárodná vedecká konferencia, sv.4

Pages from

85 - 90

Pages count

6