Publication result detail

Chybí název

ŠIKULA, J.

Original Title

Chybí název

English Title

Chybí název

Type

Paper in proceedings (conference paper)

Original Abstract

Reliability Indicators for Thin and Thick Film Resistors

English abstract

Reliability Indicators for Thin and Thick Film Resistors

Authors

ŠIKULA, J.

Released

01.01.1999

Publisher

Components Technology Institute, Inc.

Location

Huntsville, USA

ISBN

80-01-0195

Book

CARTS 99

Pages from

292

Pages count

5

BibTex

@inproceedings{BUT214,
  author="Josef {Šikula}",
  title="Chybí název",
  booktitle="CARTS 99",
  year="1999",
  pages="5",
  publisher="Components Technology Institute, Inc.",
  address="Huntsville, USA",
  isbn="80-01-0195"
}