Publication result detail

Low-frequency Noise Measurements used for semiconductors light active devices

VANĚK, J.; CHOBOLA, Z.

Original Title

Low-frequency Noise Measurements used for semiconductors light active devices

English Title

Low-frequency Noise Measurements used for semiconductors light active devices

Type

Paper in proceedings (conference paper)

Original Abstract

Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.

English abstract

Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.

Keywords

Low frequency noise, diagnostic, Silicon, Solar Cells

Key words in English

Low frequency noise, diagnostic, Silicon, Solar Cells

Authors

VANĚK, J.; CHOBOLA, Z.

Released

24.05.2005

Location

Austin, Texas

ISBN

0-8194-5839-2

Book

Noise in Devices

Pages from

86

Pages to

93

Pages count

8

BibTex

@inproceedings{BUT21250,
  author="Jiří {Vaněk} and Zdeněk {Chobola}",
  title="Low-frequency Noise Measurements used for semiconductors light active devices",
  booktitle="Noise in Devices",
  year="2005",
  pages="86--93",
  address="Austin, Texas",
  isbn="0-8194-5839-2"
}