Přístupnostní navigace
E-application
Search Search Close
Publication result detail
RECMAN M.
Original Title
Bipolar transistor structure electrical characterization
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
The bipolar transistor model parameters extraction method based on device simulator generated electrical characteristics is presented. The forward active region electrical characteristics generated by device simulator DESSIS substitute for the measured ones. The methodology links the device simulator DESSIS and electrical simulator HSPICE and enables to extract parameter numerical values of HSPICE built-in bipolar transistor model. The individual steps to create bipolar transistor structure, generate corresponding mesh, simulate device structure, convert electrical data from DESSIS to HSPICE, extract model parameter values and evaluate the results are described.
English abstract
Keywords
device simulation, circuit simulation, model parameters extraction
Key words in English
Authors
Released
01.01.2005
Publisher
Nakl. Novotný
Location
Brno
ISBN
80-214-3042-7
Book
Socrates Workshop 2005, Intensive Training Programme in Electronic System Design – Proceedings
Pages from
63
Pages count
5
BibTex
@inproceedings{BUT20416, author="Milan {Recman}", title="Bipolar transistor structure electrical characterization", booktitle="Socrates Workshop 2005, Intensive Training Programme in Electronic System Design – Proceedings", year="2005", pages="5", publisher="Nakl. Novotný", address="Brno", isbn="80-214-3042-7" }