Publication result detail

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

VANĚK, J., CHOBOLA, Z.

Original Title

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

English Title

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

Type

Paper in proceedings (conference paper)

Original Abstract

Transport and noise characteristic of forward biased 2.3 um CW GaSb laser diodes were measured in order to evaluate new technology.

English abstract

Transport and noise characteristic of forward biased 2.3 um CW GaSb laser diodes were measured in order to evaluate new technology.

Key words in English

Noise,Laser diodes, GaSb

Authors

VANĚK, J., CHOBOLA, Z.

Released

14.05.2006

Publisher

Elekctron Devices Society

Location

Belgrade, Serbia and Montenegro

ISBN

1-4244-0116-X

Book

25th International conference on Microelectronics

Pages from

307

Pages count

2

BibTex

@inproceedings{BUT19984,
  author="Jiří {Vaněk} and Zdeněk {Chobola}",
  title="Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes",
  booktitle="25th International conference on Microelectronics",
  year="2006",
  pages="2",
  publisher="Elekctron Devices Society",
  address="Belgrade, Serbia and Montenegro",
  isbn="1-4244-0116-X"
}