Structural analysis of imperfections in contacts of graphene chemiresistors

Structural analysis of imperfections in contacts of graphene chemiresistors

WoS Article

The aim of the presented paper is to take a commercially available prefabricated field effect graphene transistor sensor and to expose it to conditions of normal operation, which are different from clean and standardized laboratory conditions The effect of commonly present gases, humidity, light, possible contaminations like carbon and other phenomena have been allowed to interact with the sensor, which was then analyzed by a series of tests. The structure has been observed by Scanning Transmission Electron Microscopy (STEM), which included both High-Angle Annular Dark Field (HAADF) imaging and energy-dispersive X-ray spectroscopy (EDX). This method, together with Raman spectroscopy and secondary Ion Mass Spectroscopy (SIMS), was used to obtain information about chemical composition. Lastly, the electric properties were observed by taking the current–voltage (IV) characteristics as well as spectral density of current noise to observe changes to the sensor operation ability. The obtained data provide insight into the changes in structure, composition and behavior of the carbon sensor under non-laboratory conditions in order to establish the viability of the sensors in question in practical, less than ideal circumstances in contrast to commonly presented information from pristine, uncontaminated device in ideal laboratory conditions.

The aim of the presented paper is to take a commercially available prefabricated field effect graphene transistor sensor and to expose it to conditions of normal operation, which are different from clean and standardized laboratory conditions The effect of commonly present gases, humidity, light, possible contaminations like carbon and other phenomena have been allowed to interact with the sensor, which was then analyzed by a series of tests. The structure has been observed by Scanning Transmission Electron Microscopy (STEM), which included both High-Angle Annular Dark Field (HAADF) imaging and energy-dispersive X-ray spectroscopy (EDX). This method, together with Raman spectroscopy and secondary Ion Mass Spectroscopy (SIMS), was used to obtain information about chemical composition. Lastly, the electric properties were observed by taking the current–voltage (IV) characteristics as well as spectral density of current noise to observe changes to the sensor operation ability. The obtained data provide insight into the changes in structure, composition and behavior of the carbon sensor under non-laboratory conditions in order to establish the viability of the sensors in question in practical, less than ideal circumstances in contrast to commonly presented information from pristine, uncontaminated device in ideal laboratory conditions.

Graphene; Sensor; SEM; EDX; SIMS

Graphene; Sensor; SEM; EDX; SIMS

KASPAR, P.; ŠIŠKA VIRÁGOVÁ, E.; DALLAEV, R.; PAPEŽ, N.; MACKŮ, R.; GRMELA, L.; ŠIK, O.; SEDLÁK, P.; SOBOLA, D.

11.05.2025

Elsevier

1873-5584

APPLIED SURFACE SCIENCE

704

163501

Kingdom of the Netherlands

6

https://www.sciencedirect.com/science/article/pii/S0169433225012164