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ALDRIDGE, R.; KUBÁNEK, D.; KOTON, J.; FREEBORN, T.
Original Title
Generalized Approach for Fractional-Order Low-Pass Butterworth Filter Realization with an Inverse Follow the Leader Filter (IFLF) Topology
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
This research presents a generalized approach to determine the coefficients to realize any (N+α) fractional-order low-pass Butterworth response using transfer function forms based on the Inverse Follow the Leader Filter (IFLF) topology. This approach automates the process to create and assemble the required transfer function (based on user specified values) and then apply a numerical optimization to estimate the necessary coefficients to achieve the target filter magnitude response. MATLAB simulations of (2+α) and (10+α) order filters using the generalized approach validate the process. Further, an experimental 2.5-order low-pass filter is experimentally realized (using an approximated fractional-order capacitor) to validate the characteristics of a low-pass filter designed using this process.
English abstract
Keywords
Capacitors;Low-pass filters;Transfer functions;Filtering algorithms;Approximation algorithms;Topology;Numerical models;MATLAB;Integrated circuit modeling;Optimization
Key words in English
Authors
Released
22.03.2025
Publisher
IEEE
Location
Concord, NC, USA
ISBN
979-8-3315-0484-7
Book
Proceedings of IEEE SoutheastCon 2025 Conference
Pages from
1596
Pages to
1602
Pages count
7
URL
https://ieeexplore.ieee.org/document/10971674
BibTex
@inproceedings{BUT197770, author="Rowan {Aldridge} and David {Kubánek} and Jaroslav {Koton} and Todd {Freeborn}", title="Generalized Approach for Fractional-Order Low-Pass Butterworth Filter Realization with an Inverse Follow the Leader Filter (IFLF) Topology", booktitle="Proceedings of IEEE SoutheastCon 2025 Conference", year="2025", pages="1596--1602", publisher="IEEE", address="Concord, NC, USA", doi="10.1109/SoutheastCon56624.2025.10971674", isbn="979-8-3315-0484-7", url="https://ieeexplore.ieee.org/document/10971674" }