Publication result detail

28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

BOSIO, A.; BERNARDI, P.; TRAIOLA, M.; MRÁZEK, V.

Original Title

28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

English Title

28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Type

Conference proceedings

Original Abstract

This proceedings contains reviewed papers accepted for publication and presentation at the 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2025). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

English abstract

This proceedings contains reviewed papers accepted for publication and presentation at the 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2025). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Keywords

electronic circuit, design, test, design method, digital circuit, analog circuit

Key words in English

electronic circuit, design, test, design method, digital circuit, analog circuit

Authors

BOSIO, A.; BERNARDI, P.; TRAIOLA, M.; MRÁZEK, V.

Released

01.05.2025

Publisher

Institute of Electrical and Electronics Engineers

Location

Lyon

ISBN

979-8-3315-2801-0

Pages count

168

BibTex

@proceedings{BUT197714,
  editor="BOSIO, A. and BERNARDI, P. and TRAIOLA, M. and MRÁZEK, V.",
  title="28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2025",
  pages="168",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Lyon",
  doi="10.1109/DDECS63720.2025",
  isbn="979-8-3315-2801-0"
}