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AL SOUD, A.; ABER, A.; HOLCMAN, V.; SEDLÁK, P.; SOBOLA, D.
Original Title
Simulation of the Electrical Properties of a Graphene Monolayer Field Effect Transistor
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
Field-effect graphene transistors are finding increasing commercial and research applications. Simulation is an important step in facilitating this transition. It contributes to understanding the work process, identifying potential issues and minimizing the cost of production. In this work, the electrical characteristics of back-gated graphene field-effect transistor were simulated using ANSYS electronics software. The output current was studied by applying a voltage difference between the source and drain ranging from -5 mV to 5 mV. The back-gate applied voltage was -50 to 50 V. The results show that the gate voltage induced a similar change in both the contact and channel resistance but did not change the density of mobility of positive and negative carriers
English abstract
Keywords
field effect transistors; graphene; mobility
Key words in English
Authors
RIV year
2025
Released
01.12.2024
Publisher
IEEE
Location
NEW YORK
ISBN
979-8-3503-7977-8
Book
International Vacuum Nanoelectronics Conference
2164-2370
Pages count
2
URL
https://ieeexplore.ieee.org/document/10652423
BibTex
@inproceedings{BUT197292, author="Ammar {Alsoud} and Vladimír {Holcman} and Dinara {Sobola} and Ahmad M. D. {Jaber} and Petr {Sedlák}", title="Simulation of the Electrical Properties of a Graphene Monolayer Field Effect Transistor", booktitle="International Vacuum Nanoelectronics Conference", year="2024", pages="2", publisher="IEEE", address="NEW YORK", doi="10.1109/IVNC63480.2024.10652423", isbn="979-8-3503-7977-8", url="https://ieeexplore.ieee.org/document/10652423" }