Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters

Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters

WoS Article

This study investigates electron emission from copper broad-area emitters (CBAEs) and copper broad-area composite emitters (CBACEs) based on the principles of trapping and conductive pathways. Emission current measurements were conducted on two CBACEs, which consisted of copper coated with a 300-400 mu m epoxy resin and subjected to high voltages up to 15 kV. The research specifically examines the 'switch-on' and collapse phenomena occurring within the epoxy layer. Field emission microscopy (FEM) was utilized in a high-vacuum environment ( 10-6 mbar) to observe these effects. A comprehensive model is developed to explain the formation of conductive pathways within the epoxy layer, allowing electrons transfer from traps to the surface. This model treats the composite emitter as a trap-rich capacitor. The study also clarifies the effects of trap density and epoxy layer thickness on the collapse process. To gain a deeper understanding of the model, changes in the I-V curve were examined. Simulations, scanning electron microscopy-energy dispersive x-ray spectroscopy (SEM-EDX) images, and Fourier transform infrared spectroscopy (FTIR) analysis were employed to understand the collapse mechanism of the epoxy collapse. Additionally, Nyquist and Cole-Cole plots were analyzed across frequencies ranging from 1 to 106 Hz before and after applying a high electric field on the samples, revealing changes in the capacitive component and the role of diodes in the formation of conductive channels.

This study investigates electron emission from copper broad-area emitters (CBAEs) and copper broad-area composite emitters (CBACEs) based on the principles of trapping and conductive pathways. Emission current measurements were conducted on two CBACEs, which consisted of copper coated with a 300-400 mu m epoxy resin and subjected to high voltages up to 15 kV. The research specifically examines the 'switch-on' and collapse phenomena occurring within the epoxy layer. Field emission microscopy (FEM) was utilized in a high-vacuum environment ( 10-6 mbar) to observe these effects. A comprehensive model is developed to explain the formation of conductive pathways within the epoxy layer, allowing electrons transfer from traps to the surface. This model treats the composite emitter as a trap-rich capacitor. The study also clarifies the effects of trap density and epoxy layer thickness on the collapse process. To gain a deeper understanding of the model, changes in the I-V curve were examined. Simulations, scanning electron microscopy-energy dispersive x-ray spectroscopy (SEM-EDX) images, and Fourier transform infrared spectroscopy (FTIR) analysis were employed to understand the collapse mechanism of the epoxy collapse. Additionally, Nyquist and Cole-Cole plots were analyzed across frequencies ranging from 1 to 106 Hz before and after applying a high electric field on the samples, revealing changes in the capacitive component and the role of diodes in the formation of conductive channels.

composites broad area emitters; field electron emission; epoxy resin; trap; conductive pathways

composites broad area emitters; field electron emission; epoxy resin; trap; conductive pathways

ALSOUD, A.;MOUSA, M.S.;AL-BASHAISH, S.R.;MAGHRABI,M.;AL-JBARART, A.A. et al.

2025

01.11.2024

IOP Publishing Ltd

BRISTOL

1402-4896

Physica Scripta

99

11

United Kingdom of Great Britain and Northern Ireland

1

16

16

https://iopscience.iop.org/article/10.1088/1402-4896/ad80df/pdf