Publication result detail

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

SEKANINA, L.; FEY, G.; RAIK, J.; AUNET, S.; RŮŽIČKA, R.

Original Title

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

English Title

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Type

Conference proceedings

Original Abstract

The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Czech Republic (1997, 2002, 2006, 2009), Poland (1998, 2003, 2007), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), Austria (2010), Germany (2011) and Estonia (2012). DDECS 2013 will take place in Karlovy Vary (Carlsbad), a historically known spa city located about 140 km west of Prague. The Symposium is organized by Brno University of Technology, Faculty of Information Technology, and sponsored by the Test Technology Technical Council (TTTC) of theIEEE Computer Society.

English abstract

The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Czech Republic (1997, 2002, 2006, 2009), Poland (1998, 2003, 2007), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), Austria (2010), Germany (2011) and Estonia (2012). DDECS 2013 will take place in Karlovy Vary (Carlsbad), a historically known spa city located about 140 km west of Prague. The Symposium is organized by Brno University of Technology, Faculty of Information Technology, and sponsored by the Test Technology Technical Council (TTTC) of theIEEE Computer Society.

Authors

SEKANINA, L.; FEY, G.; RAIK, J.; AUNET, S.; RŮŽIČKA, R.

Released

17.04.2013

Publisher

IEEE Computer Society

Location

Brno

ISBN

978-1-4673-6133-0

Pages count

300

BibTex

@proceedings{BUT192901,
  editor="SEKANINA, L. and FEY, G. and RAIK, J. and AUNET, S. and RŮŽIČKA, R.",
  title="IEEE 16th International Symposium on Design and Diagnostics of  Electronic Circuits & Systems",
  year="2013",
  pages="300",
  publisher="IEEE Computer Society",
  address="Brno",
  isbn="978-1-4673-6133-0"
}