Publication result detail

Formal Approach to RTL Testability Analysis

KOTÁSEK, Z.; RŮŽIČKA, R.; HLAVIČKA, J.

Original Title

Formal Approach to RTL Testability Analysis

English Title

Formal Approach to RTL Testability Analysis

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

In the paper a formal approach to the RT level testability analysis ispresented. It is based on the structural analysis of the circuit underdesign and the classification of circuit elements. The elements areclassified on the basis of their possible role during the testapplication. The principles known from the theory of sets andmathematical logic are utilised to define the role of registers duringthe test application. The principles of developing the RT leveltestability analysis algorithms are then presented to identifyregisters for partial scan and parallel paths to apply the test of thecircuit.

English abstract

In the paper a formal approach to the RT level testability analysis ispresented. It is based on the structural analysis of the circuit underdesign and the classification of circuit elements. The elements areclassified on the basis of their possible role during the testapplication. The principles known from the theory of sets andmathematical logic are utilised to define the role of registers duringthe test application. The principles of developing the RT leveltestability analysis algorithms are then presented to identifyregisters for partial scan and parallel paths to apply the test of thecircuit.

Keywords

RTL testability analysis

Key words in English

RTL testability analysis

Authors

KOTÁSEK, Z.; RŮŽIČKA, R.; HLAVIČKA, J.

Released

01.01.2000

Publisher

unknown

Location

Rio de Janeiro

Book

sborník konference IEEE LATW 2000

Pages from

98

Pages to

103

Pages count

6

BibTex

@inproceedings{BUT191916,
  author="Zdeněk {Kotásek} and Richard {Růžička} and Jan {Hlavička}",
  title="Formal Approach to RTL Testability Analysis",
  booktitle="sborník konference IEEE LATW 2000",
  year="2000",
  pages="98--103",
  publisher="unknown",
  address="Rio de Janeiro"
}