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RŮŽIČKA, R.
Original Title
Data Dependent I Path and their Utilisation in DFT
English Title
Type
Paper in proceedings outside WoS and Scopus
Original Abstract
This paper describes an algorithm for utilisation of data paths in the digital circuit, in what functional units occur. These paths, called i paths, are used to transport test patterns and responses to them during the test of the circuit. Some functional units have an identity mode conditioned by the presence of concrete data (e.g. zero for an adder) on their inputs. When these dependencies are taken into account, the cost of modifications for testability of the circuit can be significantly reduced.
English abstract
Keywords
i path, design-for-testability, i mode, data dependent i mode
Key words in English
Authors
Released
01.01.2000
Publisher
Akademické nakladatelství CERM
Location
Brno
ISBN
80-7204-155-X
Book
Sborník prací studentů a doktorandů FEI VUT
Pages from
228
Pages to
230
Pages count
3
BibTex
@inproceedings{BUT191625, author="Richard {Růžička}", title="Data Dependent I Path and their Utilisation in DFT", booktitle="Sborník prací studentů a doktorandů FEI VUT", year="2000", pages="228--230", publisher="Akademické nakladatelství CERM", address="Brno", isbn="80-7204-155-X" }