Publication result detail

The Proposal for Optimalization of Direction of Tilt Measurement in Small Angles

JUNASOVÁ, V.; LEVEK, V.; ŠTEFFAN, P.

Original Title

The Proposal for Optimalization of Direction of Tilt Measurement in Small Angles

English Title

The Proposal for Optimalization of Direction of Tilt Measurement in Small Angles

Type

Paper in proceedings (conference paper)

Original Abstract

This work focuses on the measurement of tilt and the tilt direction specifically in small angles. Particularly problematic is the measurement of the tilt direction within tilt angles up to 10°. In such small angles the direction is excessively impacted by noise and it is impossible to measure it precisely. However, in application where the accurate information about it is needed one accelerometer might not be sufficient enough. The method proposed in this paper introduces two accelerometers shifted from each other by 45° counterclockwise in the x and z axes at the same time. The axes of the shifted accelerometer are not affected by the noise as considerably, and therefore the measurement of tilt direction is more accurate. This claim is supported with graphs and measured data. Furthermore, the work includes the introduction of a device designed for this purpose and derivation of needed equations. The proposed optimalization allows to measure tilt from vertical line and its direction relatively easily with enlarged precision. This method can be an alternative to the time-consuming utility programs and complex digital filters which would be otherwise needed in applications concerning precise measurement of the tilt direction. Overall, this is a simple solution that does not bring unwanted additional computational or financial costs.

English abstract

This work focuses on the measurement of tilt and the tilt direction specifically in small angles. Particularly problematic is the measurement of the tilt direction within tilt angles up to 10°. In such small angles the direction is excessively impacted by noise and it is impossible to measure it precisely. However, in application where the accurate information about it is needed one accelerometer might not be sufficient enough. The method proposed in this paper introduces two accelerometers shifted from each other by 45° counterclockwise in the x and z axes at the same time. The axes of the shifted accelerometer are not affected by the noise as considerably, and therefore the measurement of tilt direction is more accurate. This claim is supported with graphs and measured data. Furthermore, the work includes the introduction of a device designed for this purpose and derivation of needed equations. The proposed optimalization allows to measure tilt from vertical line and its direction relatively easily with enlarged precision. This method can be an alternative to the time-consuming utility programs and complex digital filters which would be otherwise needed in applications concerning precise measurement of the tilt direction. Overall, this is a simple solution that does not bring unwanted additional computational or financial costs.

Keywords

accelerometer, shift, direction, inclination, multiaccelerometer application

Key words in English

accelerometer, shift, direction, inclination, multiaccelerometer application

Authors

JUNASOVÁ, V.; LEVEK, V.; ŠTEFFAN, P.

RIV year

2024

Released

06.07.2023

Publisher

IEEE

ISBN

979-8-3503-3484-5

Book

2023 46th International Spring Seminar on Electronics Technology (ISSE)

ISBN

2161-2536

Periodical

Conference proceedings (International Spring Seminar on Electronics Technology)

Volume

46

Number

1

State

United States of America

Pages from

1

Pages to

5

Pages count

5

URL

BibTex

@inproceedings{BUT184447,
  author="Veronika {Junasová} and Vladimír {Levek} and Pavel {Šteffan}",
  title="The Proposal for Optimalization of Direction of Tilt Measurement in Small Angles",
  booktitle="2023 46th International Spring Seminar on Electronics Technology (ISSE)",
  year="2023",
  journal="Conference proceedings (International Spring Seminar on Electronics Technology)",
  volume="46",
  number="1",
  pages="1--5",
  publisher="IEEE",
  doi="10.1109/ISSE57496.2023.10168411",
  isbn="979-8-3503-3484-5",
  url="https://ieeexplore.ieee.org/document/10168411/keywords#keywords"
}