Publication result detail

Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography

ZEMEK, M.; ŠALPLACHTA, J.; ZIKMUND, T.; OMOTE, K.; TAKEDA, Y.; OBERTA, P.; KAISER, J.

Original Title

Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography

English Title

Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

Misalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.

English abstract

Misalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.

Keywords

Computed tomography;Rotation Axis;Tuning-fork artifact;Automatic

Key words in English

Computed tomography;Rotation Axis;Tuning-fork artifact;Automatic

Authors

ZEMEK, M.; ŠALPLACHTA, J.; ZIKMUND, T.; OMOTE, K.; TAKEDA, Y.; OBERTA, P.; KAISER, J.

RIV year

2024

Released

01.03.2023

Publisher

Elsevier

ISBN

2949-673X

Periodical

Tomography of Materials and Structures

Volume

1

Number

March 2023

State

Kingdom of the Netherlands

Pages from

1

Pages to

17

Pages count

17

URL

https://www.sciencedirect.com/science/article/pii/S2949673X2200002X

Full text in the Digital Library

http://hdl.handle.net/11012/244321

BibTex

@article{BUT180531,
  author="Marek {Zemek} and Jakub {Šalplachta} and Tomáš {Zikmund} and Kazuhiko {Omote} and Yoshihiro {Takeda} and Peter {Oberta} and Jozef {Kaiser}",
  title="Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography",
  journal="Tomography of Materials and Structures",
  year="2023",
  volume="1",
  number="March 2023",
  pages="1--17",
  doi="10.1016/j.tmater.2022.100002",
  issn="2949-673X",
  url="https://www.sciencedirect.com/science/article/pii/S2949673X2200002X"
}

Documents

1-s2.0-S2949673X2200002X-main